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Diffraktometrische Substrukturanalyse
Author(s) -
Oettel H.
Publication year - 1977
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19770120308
Subject(s) - substructure , grain size , materials science , intensity (physics) , physics , optics , metallurgy , structural engineering , engineering
Starting from the work of W ARREN about the influence of grain size on intensity fluctuations of X‐ray interferences simple relations between these fluctuations and substructure parameters as subgrain size and desorientation are derived. As can be shown measurements with different beam divergencies allow to estimate subgrain size and desorientation separately. Combined X‐ray and TEM investigations on deformed and annealed armco‐iron show the usefulness of the proposed method of diffractometrical substructure analysis.