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Some extents to the VAN DER P AUW method
Author(s) -
Lourido Javier
Publication year - 1977
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19770120304
Subject(s) - electrical resistivity and conductivity , linearity , constant (computer programming) , sample (material) , sensitivity (control systems) , physics , mathematics , computer science , electronic engineering , thermodynamics , engineering , quantum mechanics , programming language
Abstract The linearity of a system composed of a sample on which resistivity (ϱ 0 ) and the Hall constant ( R H 0 ) is measured by the VAN DER P AUW method in the case of non‐point contacts is shown. Influence of contact dimensions on results is discussed, both theoretically and experimentally, on quantitative basis. Equations for the output currents involving the electrical and geometrical characteristics of the sample are given. These currents determine the necessary equipment sensitivity for effect detection.