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Broadening of X‐ray diffraction lines of crystals containing dislocation distributions
Author(s) -
Wilkens M.
Publication year - 1976
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19760111108
Subject(s) - diffraction , dislocation , x ray , line (geometry) , materials science , crystallography , x ray crystallography , diffraction topography , optics , condensed matter physics , physics , chemistry , geometry , mathematics
The first part of the paper deals with a brief review over the present stage of the (kinematical) theory of the broadening of X‐ray diffraction lines of crystals containing dislocation distributions. In the second part experiments of X‐ray line broadening of plastically deformed Cu and NaCl single crystals are reported by which the validity of the theoretical approaches are tested. It is shown that values of the dislocation density and the elastically stored energy derived from broadened X‐ray diffraction lines agree well with corresponding data obtained by other experimental techniques.