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Growth, structure and some properties of oriented Sb (S, O) I films
Author(s) -
Sheftal R. N.,
Nikitin K. V.,
Savitskaya Y. S.,
Ormont A. B.,
Kuchta N. P.
Publication year - 1976
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19760110404
Subject(s) - electron microprobe , crystallization , materials science , ferroelectricity , phase (matter) , crystallography , coupling (piping) , microprobe , analytical chemistry (journal) , mineralogy , chemistry , composite material , dielectric , metallurgy , optoelectronics , organic chemistry
X‐ray and electron microprobe analyses of Sb(S, O)I films structure and composition have been performed. The films under investigation were prepared by crystallization from the melt in close spacing. It was revealed that the SbS 0.8 O 0.2 I structure was isomorphic t the SbSI one. The ferroelectric phase transition was observed at 75°C. The electromechanical coupling factor was 0.3 at 50°C.