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Etch pits on Te basal planes
Author(s) -
Kalinski Zb.,
Lehmann G.
Publication year - 1976
Publication title -
kristall und technik
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19760110310
Subject(s) - basal plane , materials science , prism , dislocation , basal (medicine) , etch pit density , crystallography , etching (microfabrication) , composite material , optics , chemistry , biology , physics , insulin , layer (electronics) , endocrinology
Prism face dislocation densities of Czochralski‐grown Te single crystals were determined and a new etchant for the basal planes tested, these being prepared by spark‐erosive cutting.
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