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Application of X‐ray diffraction topography for the study of Al single crystals plastically deformed at low temperatures
Author(s) -
Novikova I. G.,
Startsev V. I.,
Didenko D. A.
Publication year - 1975
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19750100307
Subject(s) - metallography , materials science , crystallography , diffraction , dislocation , deformation (meteorology) , single crystal , slip (aerodynamics) , x ray crystallography , deformation bands , lüders band , optics , composite material , microstructure , chemistry , physics , thermodynamics
The Lang method has been used to investigate regularities and peculiarities of formation of Al single crystal dislocation structure in various stages of the stress‐strain curve at 77.3 and 4.2°K up to high strains. The low temperature deformation of crystals has been found to cause a sharp localization of the deformation into slip bands that correspond to different glide systems. A comparison with metallography is added.