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On the dark‐field image technique in the identification of very small particles in thin foils
Author(s) -
Eysymontt J.,
Schwedler A.
Publication year - 1973
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19730081110
Subject(s) - electron diffraction , diffraction , dark field microscopy , materials science , lattice (music) , condensed matter physics , a priori and a posteriori , field (mathematics) , nitride , physics , crystallography , optics , nanotechnology , chemistry , mathematics , microscopy , layer (electronics) , acoustics , philosophy , epistemology , pure mathematics
The possibility of identification of very small particles of a second phase precipitation is reported which take such a small volume in the structure that it is impossible to get a visualable electron diffraction pattern from the selective diffraction technique. The evaluation of interplanar spacings and interplanar angles of crystallographic lattice of such particles is possible by the dark field image technique, if the orientation relationship between them and matrix is known „a priori”. The application of that method has been illustrated by examples of the identification of copper particles as well as those of carbo‐nitrides type MX in low alloy steels.