X‐Ray Topographic Investigation of Dendritic Silicon Crystals | Zendy

Dashevsky M. Ya. | Zendy; Isaakjan V. A. | Zendy; Khatsernov M. A. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

X‐Ray Topographic Investigation of Dendritic Silicon Crystals

Author(s) -

Dashevsky M. Ya.,

Isaakjan V. A.,

Khatsernov M. A.

Publication year - 1972

Publication title -

kristall und technik

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0023-4753

DOI - 10.1002/crat.19720071207

Subject(s) - lamella (surface anatomy) , dislocation , silicon , crystallography , materials science , volume (thermodynamics) , crystal (programming language) , surface (topology) , x ray , condensed matter physics , optics , geometry , composite material , chemistry , optoelectronics , thermodynamics , physics , mathematics , computer science , programming language

Using Lang and double‐crystal X‐ray topographic methods the dislocation structure of dendritic silicon crystals have been investigated. It is shown that the surface layers of these crystals have a more perfect structure than their bulk volume. The twin lamella is a dislocation‐free formation and there are dislocation‐free zones ∼ 1,5 mm in width in the volume of crystals.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research