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X‐Ray Topographic Investigation of Dendritic Silicon Crystals
Author(s) -
Dashevsky M. Ya.,
Isaakjan V. A.,
Khatsernov M. A.
Publication year - 1972
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19720071207
Subject(s) - lamella (surface anatomy) , dislocation , silicon , crystallography , materials science , volume (thermodynamics) , crystal (programming language) , surface (topology) , x ray , condensed matter physics , optics , geometry , composite material , chemistry , optoelectronics , thermodynamics , physics , mathematics , computer science , programming language
Using Lang and double‐crystal X‐ray topographic methods the dislocation structure of dendritic silicon crystals have been investigated. It is shown that the surface layers of these crystals have a more perfect structure than their bulk volume. The twin lamella is a dislocation‐free formation and there are dislocation‐free zones ∼ 1,5 mm in width in the volume of crystals.