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A precision X‐ray method for the determination of the orientation of single crystal surfaces
Author(s) -
Schmidt G. K.
Publication year - 1970
Publication title -
kristall und technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0023-4753
DOI - 10.1002/crat.19700050215
Subject(s) - orientation (vector space) , x ray , optics , crystal (programming language) , single crystal , materials science , computer science , crystallography , geometry , physics , mathematics , chemistry , programming language
A precision method for the determination of the orientation of single crystal surfaces is describes enabling us to ascertain the orientation data from an indexed Laue photograph by precise measurement of lengths and angles, without the necessity of knowing the exact single crystal ‐ film distance. An example shows the individual steps of the procedure.
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