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Cover Feature: Investigation of Surface Sulfurization in CuIn 1− x Ga x S 2− y Se y Thin Films by Using Kelvin Probe Force Microscopy (ChemPhysChem 3/2018)
Author(s) -
Kim Haeri,
Park Se Jin,
Kim Byungwoo,
Hwang Yun Jeong,
Min Byoung Koun
Publication year - 2018
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201800091
Subject(s) - cover (algebra) , schematic , materials science , feature (linguistics) , atomic force microscopy , thin film , band diagram , diffraction , crystallography , analytical chemistry (journal) , band gap , physics , chemistry , optics , nanotechnology , optoelectronics , mechanical engineering , chromatography , electronic engineering , engineering , philosophy , linguistics
The Cover Feature shows the Kelvin probe force microscopy setup used to investigate CuIn 1− x Ga x S 2− y Se y (CIGSSe) thin films under illumination along with schematic band diagrams for band‐to‐band and trap‐to‐band transitions. More information can be found in the Full Paper by H. Kim et al. on page 261 in Issue 3, 2018 (DOI: 10.1002/cphc.201701019).