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Electronic Structure Characterization of Cross‐Linked Sulfur Polymers
Author(s) -
Cappel Ute B.,
Liu Peng,
Johansson Fredrik O. L.,
Philippe Bertrand,
Giangrisostomi Erika,
Ovsyannikov Ruslan,
Lindblad Andreas,
Kloo Lars,
Gardner James M.,
Rensmo Håkan
Publication year - 2018
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201800043
Subject(s) - polymer , x ray photoelectron spectroscopy , sulfur , electronic structure , doping , materials science , conductivity , valence (chemistry) , thin film , fermi level , lithium (medication) , chemistry , chemical engineering , inorganic chemistry , polymer chemistry , nanotechnology , organic chemistry , computational chemistry , optoelectronics , medicine , physics , quantum mechanics , endocrinology , engineering , electron
Cross‐linked polymers of elemental sulfur are of potential interest for electronic applications as they enable facile thin‐film processing of an abundant and inexpensive starting material. Here, we characterize the electronic structure of a cross‐linked sulfur/diisopropenyl benzene (DIB) polymer by a combination of soft and hard X‐ray photoelectron spectroscopy (SOXPES and HAXPES). Two different approaches for enhancing the conductivity of the polymer are compared: the addition of selenium in the polymer synthesis and the addition of lithium bis(trifluoromethanesulfonyl)imide (LiTFSI) during film preparation. For the former, we observe the incorporation of Se into the polymer structure resulting in a changed valence‐band structure. For the latter, a Fermi level shift in agreement with p‐type doping of the polymer is observed and also the formation of a surface layer consisting mostly of TFSI anions.