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Electronic Transport of MoS 2 Monolayered Flakes Investigated by Scanning Electrochemical Microscopy
Author(s) -
Henrotte Olivier,
Bottein Thomas,
Casademont Hugo,
Jaouen Kevin,
Bourgeteau Tiphaine,
Campidelli Stephane,
Derycke Vincent,
Jousselme Bruno,
Cornut Renaud
Publication year - 2017
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201700343
Subject(s) - scanning electrochemical microscopy , molybdenum disulfide , materials science , nanotechnology , chemical vapor deposition , scanning electron microscope , electrochemistry , electrocatalyst , molybdenum , chemical engineering , electrode , chemistry , composite material , metallurgy , engineering
The amazing properties of 2D materials are envisioned to revolutionize several domains such as flexible electronics, electrocatalysis, or biosensing. Herein we introduce scanning electrochemical microscopy (SECM) as a tool to investigate molybdenum disulfide in a straightforward fashion, providing localized information regarding the electronic transport within chemical vapor deposition (CVD)‐grown crystalline MoS 2 single layers having micrometric sizes. Our investigations show that within flakes assemblies some flakes are well electrically interconnected, with no detectable contact resistance, whereas others are not electrically connected at all, independent of the size of the physical contact between them. Overall, the work shows how the complex electronic behavior of MoS 2 flake assemblies (semiconducting nature, contact quality between flakes) can be investigated with SECM.