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Inside Cover: Reliability of Orientational Order Parameters Determined from Two‐dimensional X‐ray Diffraction Patterns: A Simulation Study (ChemPhysChem 11/2016)
Author(s) -
Jenz Frank,
Jagiella Stefan,
Glaser Matthew A.,
Giesselmann Frank
Publication year - 2016
Publication title -
chemphyschem
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201600446
Subject(s) - cover (algebra) , diffraction , order (exchange) , fourier transform , phase (matter) , orientation (vector space) , reliability (semiconductor) , materials science , liquid crystal , crystallography , optics , statistical physics , physics , chemistry , mathematics , geometry , thermodynamics , engineering , quantum mechanics , mechanical engineering , power (physics) , finance , economics
The Inside Cover picture displays the orientation of simulated rod‐like particles in a smectic A phase and a nematic phase along with their corresponding 2D diffraction patterns calculated through Fourier transform. More information can be found in the Full Paper by F. Giesselmann and co‐workers on page 1568 in Issue 11, 2016 (DOI: 10.1002/cphc.201600050).