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Correlative Atomic Force Microscopy and Localization‐Based Super‐Resolution Microscopy: Revealing Labelling and Image Reconstruction Artefacts
Author(s) -
Monserrate Aitor,
Casado Santiago,
Flors Cristina
Publication year - 2014
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201300853
Subject(s) - microscopy , fluorescence microscope , correlative , resolution (logic) , super resolution microscopy , photoactivated localization microscopy , atomic force microscopy , fluorescence lifetime imaging microscopy , materials science , image resolution , fluorescence , chemistry , nanotechnology , scanning confocal electron microscopy , optics , physics , computer science , artificial intelligence , philosophy , linguistics
Hybrid microscopy: A correlative microscopy tool that combines in situ super‐resolution fluorescence microscopy based on single‐molecule localization and atomic force microscopy is presented. Direct comparison with high‐ resolution topography allows the authors to improve fluorescence labeling and image analysis in super‐resolution imaging.