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Tip‐Enhanced Near‐Field Optical Microscopy of Quasi‐1 D Nanostructures
Author(s) -
Böhmler Miriam,
Hartschuh Achim
Publication year - 2012
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201100670
Subject(s) - photoluminescence , materials science , raman scattering , raman spectroscopy , microscopy , nanostructure , near field scanning optical microscope , excitation , nanoscopic scale , nanowire , spectroscopy , optical microscope , carbon nanotube , resolution (logic) , optoelectronics , optics , analytical chemistry (journal) , nanotechnology , chemistry , scanning electron microscope , physics , chromatography , quantum mechanics , computer science , composite material , electrical engineering , engineering , artificial intelligence
High‐resolution imaging and spectroscopy of single CdSe nanowires and carbon nanotubes using tip‐enhanced near‐field optical microscopy increases the optical excitation and emission rates within a nanoscale sample volume. The resulting signal enhancement for Raman scattering and photoluminescence as well as the tip–sample‐distance dependence are investigated.