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Imaging the Active Surfaces of Cerium Dioxide Nanoparticles
Author(s) -
Haigh Sarah J.,
Young Neil P.,
Sawada Hidetaka,
Takayanagi Kunio,
Kirkland Angus I.
Publication year - 2011
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.201100376
Subject(s) - cerium , nanoparticle , transmission electron microscopy , cathode ray , materials science , phase (matter) , optics , electron , wave function , nanotechnology , molecular physics , chemical physics , chemistry , atomic physics , physics , quantum mechanics , organic chemistry , metallurgy
Watching the changes: Aberration‐corrected transmission electron microscopy is used to image CeO 2 nanoparticles during an electron‐beam‐induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations.