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Analytical Expressions for Quantitative Scanning Electrochemical Microscopy (SECM)
Author(s) -
Lefrou Christine,
Cornut Renaud
Publication year - 2010
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.200900600
Subject(s) - scanning electrochemical microscopy , microelectrode , electrochemistry , microscopy , ultramicroelectrode , chemistry , scanning probe microscopy , simple (philosophy) , nanotechnology , analytical chemistry (journal) , materials science , optics , physics , electrode , cyclic voltammetry , chromatography , philosophy , epistemology
Scanning electrochemical microscopy (SECM), is a recent analytical technique in electrochemistry, which was developed in the 1990s and uses microelectrodes to probe various surfaces. Even with the well‐known disc microelectrodes, the system geometry is not as simple as in regular electrochemistry. As a consequence even the simplest experiments, the so‐called positive and negative feedback approach curves, cannot be described with exact analytical expressions. This review gathers all the analytical expressions available in the SECM literature in steady‐state feedback experiments. Some of them are claimed as general expressions, other are presented as approximate. Their validity is discussed in the light of the current understanding and computer facilities.