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Localized Electrografting of Vinylic Monomers on a Conducting Substrate by Means of an Integrated Electrochemical AFM Probe
Author(s) -
Ghorbal Achraf,
Grisotto Federico,
Charlier Julienne,
Palacin Serge,
Goyer Cédric,
Demaille Christophe
Publication year - 2009
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.200800803
Subject(s) - scanning electrochemical microscopy , scanning probe microscopy , substrate (aquarium) , nanotechnology , materials science , electrochemistry , electrochemical scanning tunneling microscope , microscopy , scanning ion conductance microscopy , conductive atomic force microscopy , coating , scanning electron microscope , atomic force microscopy , chemistry , electrode , scanning tunneling microscope , scanning confocal electron microscopy , optics , composite material , oceanography , physics , geology , scanning tunneling spectroscopy
An electrochemical lithographic tool for locally electrografting a non‐conducting organic coating on a conducting substrate with a submicrometer resolution is provided by atomic force scanning electrochemical microscopy (AFM‐SECM). The picture shows the topographic AFM image of the line pattern drawn with an AFM‐SECM tip on a gold surface by direct reduction of an aryl diazonium salt/acrylic acid electrolyte solution.Combinations of scanning electrochemical microscopy (SECM) with other scanning probe microscopy techniques, such as atomic force microscopy (AFM), show great promise for directing localized modification, which is of great interest for chemical, biochemical and technical applications. Herein, an atomic force scanning electrochemical microscope is used as a new electrochemical lithographic tool (L‐AFM‐SECM) to locally electrograft, with submicrometer resolution, a non‐conducting organic coating on a conducting substrate.