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A Significant Structural Advance Using STEM
Author(s) -
Thomas John Meurig
Publication year - 2008
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.200800190
Subject(s) - scanning transmission electron microscopy , rietveld refinement , oxide , complex oxide , dark field microscopy , materials science , transmission electron microscopy , optics , crystallography , nanotechnology , analytical chemistry (journal) , diffraction , chemistry , physics , microscopy , metallurgy , chromatography
Reliable model: The structure of the mixed oxide Mo, V, Nb and Te catalyst is obtained by aberration‐corrected scanning transmission electron micrographs (see figure) under high‐angle, annular dark‐field conditions. This derived model agrees well with that obtained by the more laborious method of multiple Rietveld refinement and is likely to be of great value in structural studies of other complicated oxide ceramics, phosphors and sensors.