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Resonant X‐ray Scattering: A Tool for Structure Elucidation in Liquid Crystals
Author(s) -
Gleeson Helen F.,
Hirst Linda S.
Publication year - 2006
Publication title -
chemphyschem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.016
H-Index - 140
eISSN - 1439-7641
pISSN - 1439-4235
DOI - 10.1002/cphc.200500426
Subject(s) - scattering , liquid crystal , electric field , resolution (logic) , x ray , crystallography , orientation (vector space) , chemical physics , materials science , anomalous scattering , small angle x ray scattering , crystal structure , optics , chemistry , optoelectronics , physics , geometry , mathematics , quantum mechanics , artificial intelligence , computer science
10.1002/cphc.200500426.abs The use of resonant X‐ray scattering to determine structures in liquid crystal systems is surveyed. This powerful experimental technique utilises “forbidden reflections” to determine the subtle differences in interlayer orientation that differentiate several smectic systems. The technique relies on the materials containing an atom to which the X‐ray energy can be tuned, usually sulphur or selenium. Experiments are often carried out on free‐standing films that provide a highly monodomain structure that allows high‐resolution measurements to be made, and, hence, structural details to be determined. Alternatively, resonant scattering has been demonstrated for materials contained in glass devices that permit the application of electric fields to the system, in a manner analogous to that used in liquid crystal devices. The resonant scattering technique provides unequivocal descriptions of the packing in smectic systems, and the way in which the packing is distorted in electric fields. This Minireview describes the principles behind resonant X‐ray scattering, its application to liquid crystals and some of the potential for the future.