z-logo
Premium
NIST 0:45 reflectometer
Author(s) -
Nadal Maria E.,
Early Edward A.,
Weber Will,
Bousquet Robert
Publication year - 2008
Publication title -
color research and application
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.393
H-Index - 62
eISSN - 1520-6378
pISSN - 0361-2317
DOI - 10.1002/col.20389
Subject(s) - nist , optics , reflectivity , ranging , color difference , materials science , analytical chemistry (journal) , chemistry , physics , chromatography , geology , computer science , telecommunications , geodesy , enhanced data rates for gsm evolution , natural language processing
The NIST 0:45 reflectometer measures the spectral reflectance factor at an influx angle of 0° and an efflux angle of 45° of colored, nonfluorescent specimens at room temperature, with widths ranging from 3 to 10 cm and heights from 3 to 20 cm and with an uncertainty of less than 0.5 in color difference units. Published in 2008 by John Wiley & Sons, Inc. Col Res Appl, 33, 94–99, 2008

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here