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Defects in Graphene Oxide as Structural Motifs
Author(s) -
Feicht Patrick,
Eigler Siegfried
Publication year - 2018
Publication title -
chemnanomat
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.947
H-Index - 32
ISSN - 2199-692X
DOI - 10.1002/cnma.201700357
Subject(s) - graphene , oxide , materials science , nanotechnology , metallurgy
Graphene oxide possesses defects of various kinds. The structure of graphene oxide is reviewed with focus on defects in the σ‐framework of the hexagonal lattice. We clearly distinguish between on‐plane functionalization defects and in‐plane lattice defects. Moreover, vacancy defects and hole defects are discriminated. In this context, Raman spectroscopy is introduced as a sensitive method for detecting and quantifying defects. Moreover, the visualization of in‐plane lattice defects by transmission electron microscopy (TEM) at atomic resolution is introduced. Understanding the type and density of defects in graphene oxide bears the potential for advancing the field of research while considering the specific types of defects as structural motifs.