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Drain Current in Poly(3‐hexylthiophene) Solutions during Film Formation: Correlations to Structural Changes
Author(s) -
Park Min Sang,
Aiyar Avishek,
Park Jung Ok,
Reichmanis Elsa,
Srinivasarao Mohan
Publication year - 2015
Publication title -
chemnanomat
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.947
H-Index - 32
ISSN - 2199-692X
DOI - 10.1002/cnma.201400003
Subject(s) - polymer , materials science , raman spectroscopy , quenching (fluorescence) , drop (telecommunication) , crystallization , thin film , solvent , chemical engineering , active layer , layer (electronics) , chemical physics , current (fluid) , in situ , nanotechnology , composite material , thin film transistor , organic chemistry , chemistry , optics , thermodynamics , computer science , fluorescence , physics , telecommunications , engineering
Concurrent in situ Raman spectroscopic studies and drain current measurements were performed during drop‐cast poly(3‐hexylthiophene) (P3HT) film formation. Together, these techniques allow interrogation and elucidation of the evolution of P3HT structural changes and associated electrical characteristics as the solvent evaporates. Two observations are especially significant: i) solvent continued to be present in the developing thin‐film at the point where the drain current exhibited a sharp increase and ii) continued to be observed after crystallization of the polymer. The in situ studies provide vital insights into the polymer organization and chain alignment processes at the molecular and macroscopic scales. The results suggest that final conjugated polymer thin‐film morphology can be tailored for enhanced performance and desired electronic properties through quenching of the active polymer layer at a specified time during the solidification process.