Open AccessPhotoinduced Force Microscopy as an Efficient Method Towards the Detection of Nanoplastics
Author(s) -
C. ten Have Iris,
Duijndam Adriaan J. A.,
Oord Ramon,
Berlovan den Broek Hannie J. M.,
Vollmer Ina,
Weckhuysen Bert M.,
Meirer Florian
Publication year - 2021
Publication title -
chemistry ‐ methods
Language(s) - English
Resource type - Journals
ISSN - 2628-9725
DOI - 10.1002/cmtd.202100032
Subject(s) - polystyrene , microscopy , atomic force microscopy , diffraction , materials science , infrared microscopy , chain scission , infrared , optical microscope , kelvin probe force microscope , nanotechnology , polymer chemistry , chemistry , chemical engineering , composite material , optics , physics , scanning electron microscope , polymer , engineering
Invited for this month's cover is the group of Bert M. Weckhuysen and Florian Meirer at Utrecht University (The Netherlands). The cover picture shows polystyrene nanoplastics and how they are detected with photo‐induced force microscopy. This method overcomes the diffraction limit of infrared light by employing a nano‐sized tip as detector. Oxidative degradation and chain scission occurred on the surface of the polystyrene nanoplastics in salt water, as depicted by the carbonyl and aliphatic functionalities. Detecting nano‐sized plastic particles is essential for understanding how plastic waste breaks down into smaller particles in the environment. Read the full text of their Communication at 10.1002/cmtd.202100017 .