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Reversible Addition‐fragmentation Chain Transfer Polymerization Grafted from Silicon Surface to Prepare Poly(methyl methacrylate) Brushes
Author(s) -
YUAN Kun,
LÜ LingLing,
LI ZhiFeng,
SHI XiaoNing
Publication year - 2008
Publication title -
chinese journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.28
H-Index - 41
eISSN - 1614-7065
pISSN - 1001-604X
DOI - 10.1002/cjoc.200890346
Subject(s) - chain transfer , raft , chemistry , polymer chemistry , polymerization , contact angle , silicon , x ray photoelectron spectroscopy , reversible addition−fragmentation chain transfer polymerization , methyl methacrylate , chemical engineering , ellipsometry , wafer , trichlorosilane , methacrylate , materials science , polymer , radical polymerization , nanotechnology , thin film , organic chemistry , engineering
Abstract Poly(methyl methacrylate) (PMMA) brushes grafted from silicon wafer surface were prepared using a reversible addition fragmentation chain transfer (RAFT) technique. 4‐Cyano‐4‐((thiobenzoyl)sulfanyl)pentanoic succinimide ester, a novel RAFT agent, was immobilized on the silicon wafer surface. RAFT polymerizations were then conducted from the silicon surface to polymerize from the silicon surface. Kinetic studies revealed that the thickness of the PMMA film increased almost linearly with the polymerization time after 2 h, indicating that the chain growth from the surface was a controlled process with a "living" character. The PMMA brushes were characterized using ellipsometry, X‐ray photoelectron spectra (XPS), atomic force microscopy (AFM) and contact angle measurements.