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Probing of Thin Slipping Films by Persistent External Disturbances
Author(s) -
Alleborn N.,
Sharma A.,
Delgado A.
Publication year - 2007
Publication title -
the canadian journal of chemical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.404
H-Index - 67
eISSN - 1939-019X
pISSN - 0008-4034
DOI - 10.1002/cjce.5450850504
Subject(s) - amplitude , fourier transform , laplace transform , inverse laplace transform , free surface , thin film , perturbation (astronomy) , laplace pressure , mechanics , materials science , optics , physics , mathematical analysis , mathematics , nanotechnology , surface tension , quantum mechanics
This paper investigates the propagation of thickness disturbances on the free surface of a thin viscous liquid film on a solid substrate. On the free surface of the film the disturbances are induced by moving local external pressure perturbations acting on the surface. The analysis is performed by the Fourier‐Laplace transform applied to the linearized perturbation equations for small amplitudes. The amplitude of the interface deflection caused by the disturbance, is reconstructed by the inverse Fourier‐Laplace transform and numerically evaluated in the long time limit in long wave approximation. The proposed technique appears promising for probing the slip length of a thin film by recording its free surface response to a moving perturbation.