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Void Fraction Measurement for Two‐Phase Flow Using Electrical Resistance Tomography
Author(s) -
Dong Feng,
Xu Yanbin,
Qiao Xutong,
Xu Lijun,
Xu Ling'an
Publication year - 2005
Publication title -
the canadian journal of chemical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.404
H-Index - 67
eISSN - 1939-019X
pISSN - 0008-4034
DOI - 10.1002/cjce.5450830105
Subject(s) - tomography , electrical resistance and conductance , materials science , porosity , fraction (chemistry) , two phase flow , mechanics , flow (mathematics) , composite material , physics , chemistry , optics , chromatography
Measurement of void fraction of two‐phase flows remains a challenging area. In this paper the application of an electrical resistance tomography (ERT) system for this purpose has been studied. A new approach through the direct use of the voltage data measured by the ERT system is presented. The measured voltage data are first compressed through a feature extraction, and a polynomial regression procedure is followed to obtain the relationship between the void fraction and the feature extracted. Both simulation and experiment are carried out to verify the approach. The methodology of the new approach, simulation and experimental results are presented in the paper.