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Reliable Methods for Calculation of Average Film Thickness in a Vertical Thin‐film Evaporator
Author(s) -
Taeymans Dominique A.
Publication year - 1979
Publication title -
chemie ingenieur technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.365
H-Index - 36
eISSN - 1522-2640
pISSN - 0009-286X
DOI - 10.1002/cite.330510918
Subject(s) - evaporator , citation , humanities , physics , library science , engineering physics , art , computer science , thermodynamics , heat exchanger
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