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Qualification of Image‐Based Measurement Systems for Characterization of Sprays
Author(s) -
Schulz Jonas,
Schunk Christoph,
Schleicher Eckhard,
Bart HansJörg
Publication year - 2021
Publication title -
chemie ingenieur technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.365
H-Index - 36
eISSN - 1522-2640
pISSN - 0009-286X
DOI - 10.1002/cite.202000104
Subject(s) - microscope , characterization (materials science) , optical microscope , distortion (music) , process (computing) , materials science , nanotechnology , lithography , optics , optoelectronics , computer science , scanning electron microscope , physics , composite material , amplifier , cmos , operating system
Image‐based measurement techniques become increasingly popular and expedite digitalization in chemical engineering. This article demonstrates their potential by testing two inline probes, namely modified optical multimode online probe (OMOP) and process microscope. Validations are performed with static monodisperse standards (9.2 µm to 406 µm) and fast‐moving droplets (68.6 µm to 860.7 µm; 24.5 m s −1 to 11 m s −1 ). Screening of a lithography attests both probes great distortion‐free image quality. A 1951 USAF chart attests a low optical resolution of 8 µm or 7 µm with respect to the OMOP or process microscope, respectively. The modified OMOP and process microscope reaches accuracies of 7.6 % or 5.9 % for particles and 8.2 % or 6.8 % for droplets.