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Characterization of Metal‐Organic Frameworks Using X‐ray Diffraction
Author(s) -
Herrmann Michael,
Kempa Paul Bernd,
Fietzek Harald,
Altenburg Thomas,
Polyzoidis Angelos,
Piscopo Calogero Giancarlo,
Löbbecke Stefan
Publication year - 2016
Publication title -
chemie ingenieur technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.365
H-Index - 36
eISSN - 1522-2640
pISSN - 0009-286X
DOI - 10.1002/cite.201500123
Subject(s) - nanoporous , characterization (materials science) , materials science , diffraction , metal organic framework , impurity , particle (ecology) , metal , x ray crystallography , nanotechnology , chemical engineering , process engineering , chemistry , metallurgy , adsorption , optics , organic chemistry , engineering , physics , oceanography , geology
Metal‐organic frameworks (MOFs) are nanoporous materials with a very large inner surface. Selected MOFs with a high potential for industrial application are investigated and characterized using X‐ray diffraction. During this process, impurities and defective batches can be detected at an early stage and the manufacturing processes could be refined or corrected accordingly. In addition, important information on the real structures of the products is obtained. It is thus possible to achieve the target structure and to tailor particle properties to the application profile.