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Small‐ and Wide‐Angle X‐Ray Scattering for Characterization of Nanostructured Particles
Author(s) -
Guo X.,
Gutsche A.,
Nirschl H.
Publication year - 2014
Publication title -
chemie ingenieur technik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.365
H-Index - 36
eISSN - 1522-2640
pISSN - 0009-286X
DOI - 10.1002/cite.201450179
Subject(s) - physics , humanities , art