z-logo
Premium
N‐Heterocyclic Carbene (NHC)‐Stabilized Silanechalcogenones: NHC→Si(R 2 )E (E=O, S, Se, Te)
Author(s) -
Yao Shenglai,
Xiong Yun,
Driess Matthias
Publication year - 2010
Publication title -
chemistry – a european journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.687
H-Index - 242
eISSN - 1521-3765
pISSN - 0947-6539
DOI - 10.1002/chem.200902467
Subject(s) - carbene , crystallography , chalcogen , chemistry , antibonding molecular orbital , silylene , lone pair , ylide , acceptor , nuclear magnetic resonance spectroscopy , stereochemistry , resonance (particle physics) , atomic orbital , electron , silicon , molecule , organic chemistry , catalysis , physics , particle physics , quantum mechanics , condensed matter physics
A series of N‐heterocyclic carbene‐stabilized silanechalcogenones 2 a , b (SiO), 3 a , b (SiS), 4 a , b (SiSe), and 5 a , b (SiTe) are described. The silanone complexes 2 a , b were prepared by facile oxygenation of the carbene–silylene adducts 1 a , b with N 2 O, whereas their heavier congeners were synthesized by gentle chalcogenation of 1 a , b with equimolar amounts of elemental sulfur, selenium, and tellurium, respectively. These novel compounds have been isolated in a crystalline form in high yields and have been fully characterized by a variety of techniques including IR spectroscopy, ESIMS, and multinuclear NMR spectroscopy. The structures of 2 b , 3 a , 4 a , 4 b , and 5 b have been confirmed by single‐crystal X‐ray crystallography. Due to the NHC→Si donor–acceptor electronic interaction, the SiE (E=O, S, Se, Te) moieties within these compounds are well stabilized and thus the compounds possess several ylide‐like resonance structures. Nevertheless, these species also exhibit considerable SiE double‐bond character, presumably through a nonclassical SiE π‐bonding interaction between the chalcogen lone‐pair electrons and two antibonding SiN σ* orbitals, as evidenced by their high stretching vibration modes and the shortening of the Si–E distances (between 5.4 and 6.3 %) compared with the corresponding SiE single‐bond lengths.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom