z-logo
Premium
Three‐way data analysis of a wheat growing experiment using near infrared spectral data
Author(s) -
Geladi Paul,
Manley Marena
Publication year - 2008
Publication title -
journal of chemometrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 92
eISSN - 1099-128X
pISSN - 0886-9383
DOI - 10.1002/cem.1125
Subject(s) - cultivar , smoothing , locality , infrared , mathematics , fourier transform , wavelength , near infrared spectroscopy , analytical chemistry (journal) , biological system , chemistry , agronomy , statistics , physics , optics , environmental chemistry , mathematical analysis , biology , linguistics , philosophy
An agricultural growing experiment cultivating 10 cultivars at five localities produced whole wheat flour samples that were analysed by Fourier transform near infrared (FT‐NIR) spectroscopy. This produced a three‐way data array: locality × cultivar × wavelength. By taking smoothing first derivatives and removing a noisy part of the spectra meaningful PARAFAC (PARAllel FACtor analysis) models could be produced. Two factors could be interpreted spectroscopically, showing that cultivar properties are related in a not so trivial way to average wheat hardness values and that locality variations are straightforwardly related to average protein content. Copyright © 2008 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom