Premium
Effect of Collector Roughness on Properties of Amorphous Silicon Thin‐Film Anodes
Author(s) -
Xue Wendong,
Tian Xu,
Xue Yawen,
Peng Ting,
Li Yan,
Li Yong,
Sun Jialin
Publication year - 2019
Publication title -
chemelectrochem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 59
ISSN - 2196-0216
DOI - 10.1002/celc.201900593
Subject(s) - materials science , silicon , amorphous silicon , anode , current collector , amorphous solid , foil method , surface roughness , copper , raman spectroscopy , monocrystalline silicon , sputter deposition , surface finish , thin film , composite material , optoelectronics , sputtering , metallurgy , nanotechnology , crystalline silicon , optics , electrode , crystallography , chemistry , physics , electrolyte
Abstract Uniform silicon films about 500 nm thick for lithium‐ion batteries on copper foil current collectors were prepared using a magnetron sputtering method. We discuss the surface morphology and crystal structure of the silicon films, emphasizing how the current collector affects the performance of the silicon film anode. XRD and Raman analysis demonstrate that both films are amorphous. However, the silicon film deposited onto the matte copper foil shows better cycle behavior, it can be discharged at 0.5 C with 84.1 % capacity retention about 1470 mAhg −1 after 100 cycles.