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High‐Resolution Imaging of the Initial Stages of Oxidation of Cu(111) with Scanning Electrochemical Potential Microscopy
Author(s) -
Traunsteiner Christoph,
Tu Kaiyang,
KunzeLiebhäuser Julia
Publication year - 2015
Publication title -
chemelectrochem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 59
ISSN - 2196-0216
DOI - 10.1002/celc.201402283
Subject(s) - scanning tunneling microscope , electrochemical scanning tunneling microscope , scanning ion conductance microscopy , scanning electron microscope , electrochemistry , scanning probe microscopy , scanning electrochemical microscopy , electrolyte , electrode , electrochemical potential , materials science , microscopy , analytical chemistry (journal) , electrode potential , scanning capacitance microscopy , resolution (logic) , chemistry , nanotechnology , scanning confocal electron microscopy , scanning tunneling spectroscopy , optics , physics , chromatography , artificial intelligence , computer science , composite material
Scanning electrochemical potential microscopy (SECPM) is a scanning probe technique for the detection of the electrochemical double‐layer (EDL) potential of a given working electrode (WE). We report the first high‐resolution imaging of the OH adsorbate structure formed on a Cu(111) WE in alkaline solution with SECPM, which reveals a structural parameter of (0.60±0.04) nm that is in excellent agreement with that found with electrochemical scanning tunneling microscopy. The origin of the potential used as a feedback signal in SECPM mode is discussed, focusing on leakage currents detected in the SECPM setup, faradaic reactions in the electrolyte, and electron‐tunneling processes between the tip and the WE. At potential set‐points that are typical for SECPM measurements, the potential detected with the tip is found to originate from a tunneling current. Therefore, the images recorded with SECPM cannot deliver information on the EDL potential at the WE surface in the present case.