Premium
Inside Cover: Spatially Resolved Chemical Characterization with Scanning Photoemission Spectromicroscopy: Towards Near‐Ambient‐Pressure Experiments (ChemCatChem 22/2015)
Author(s) -
Sezen Hikmet,
Alemán Belén,
Amati Matteo,
Dalmiglio Matteo,
Gregoratti Luca
Publication year - 2015
Publication title -
chemcatchem
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 1.497
H-Index - 106
eISSN - 1867-3899
pISSN - 1867-3880
DOI - 10.1002/cctc.201501142
Subject(s) - characterization (materials science) , cover (algebra) , ambient pressure , nanotechnology , materials science , chemical physics , chemistry , physics , engineering , meteorology , mechanical engineering
The Cover shows how despite the fact that the spatial resolution achieved by scanning photoelectron microscopes (SPEM) is continuously improving the investigations of nanomaterials, one of the bottlenecks is the highest pressures achievable during experiments. This value is still limited to the high‐vacuum pressure range, which is far from ideal in more realistic catalytic studies. In their Full Paper, Sezen et al. describe part of the unceasing effort in the development of technical solutions able to overcome the “pressure gap” using SPEM at the ESCAmicroscopy beamline. With their pioneering solutions for SPEM they show that the capability to acquire photoelectron maps and spectra almost reaches near ambient conditions.