Premium
Aberration‐Corrected Transmission Electron Microscopy and In Situ XAFS Structural Characterization of Pt/γ‐Al 2 O 3 Nanoparticles
Author(s) -
Sinkler Wharton,
Sanchez Sergio I.,
Bradley Steven A.,
Wen Jianguo,
Mishra Bhoopesh,
Kelly Shelly D.,
Bare Simon R.
Publication year - 2015
Publication title -
chemcatchem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.497
H-Index - 106
eISSN - 1867-3899
pISSN - 1867-3880
DOI - 10.1002/cctc.201500784
Subject(s) - x ray absorption fine structure , scanning transmission electron microscopy , extended x ray absorption fine structure , transmission electron microscopy , cluster (spacecraft) , materials science , nanoparticle , high resolution transmission electron microscopy , absorption (acoustics) , analytical chemistry (journal) , absorption spectroscopy , crystallography , spectroscopy , chemistry , optics , nanotechnology , physics , chromatography , quantum mechanics , computer science , composite material , programming language
Aberration‐corrected (AC) STEM, AC TEM and in situ X‐ray absorption fine structure spectroscopy (XAFS) were used to characterize the Pt clusters present on a 0.35 wt % Pt on γ‐alumina support after reduction in hydrogen at 700 °C. STEM high‐angle annular dark field imaging shows that cluster formation takes place at temperatures up to approximately 350 °C, and this is followed by gradual growth in cluster size for heat treatments in hydrogen up to 700 °C. The STEM data show that after 700 °C reduction the Pt clusters are present in a narrow size distribution centered at 0.88 nm, and using a method involving a redistribution of the Pt atoms using a high electron dosage in the STEM, it is shown that the clusters are present in two‐dimensional morphology. This conclusion is verified using intensity line scans. The in situ extended X‐ray absorption fine structure data are in good agreement with these observations. High‐resolution AC–TEM, which uses a broad coherent electron beam, and can thus offer advantages relative to STEM for structure determination of fine clusters, supported by image simulations of through‐focus series, were used to analyze the structures of Pt particles. The structures determined by using AC–TEM are consistent with STEM and EXAFS data in having a flat two‐dimensional morphology. Comparison of AC–STEM and AC TEM data for the same 700 °C reduced sample suggests that parallel‐beam TEM mode of imaging may be advantageous because of the less pronounced beam‐induced structural rearrangements that occur when imaging with a fine STEM probe.