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In Situ Microscopy and Spectroscopy Applied to Surfaces at Work
Author(s) -
Han HuiLing,
Melaet Gérôme,
Alayoglu Selim,
Somorjai Gabor A.
Publication year - 2015
Publication title -
chemcatchem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.497
H-Index - 106
eISSN - 1867-3899
pISSN - 1867-3880
DOI - 10.1002/cctc.201500642
Subject(s) - characterization (materials science) , synchrotron , spectroscopy , x ray photoelectron spectroscopy , microscopy , materials science , transmission electron microscopy , absorption spectroscopy , high resolution transmission electron microscopy , nanomaterials , nanotechnology , absorption (acoustics) , resolution (logic) , analytical chemistry (journal) , optics , chemistry , physics , nuclear magnetic resonance , computer science , organic chemistry , quantum mechanics , artificial intelligence
The present review discusses the current state of the art microscopic and spectroscopic characterization techniques available to study surfaces and interfaces under working conditions. Microscopic techniques such as environmental transmission electron microscopy and in situ transmission electron microscopy are first discussed showing their applications in the field of nanomaterials and catalysis. Next sum frequency generation vibrational spectroscopy is discussed, giving probing examples of surface studies in gaseous conditions. Synchrotron based X‐ray techniques are also examined with a specific focus on ambient pressure X‐ray photoelectron and absorption techniques such as near and extended X‐ray absorption fine structure. Each of the techniques is evaluated, whilst the pros and cons are discussed in term of surface sensitivity, spatial resolution and/or time resolution. The second part of the articles is articulated around the future of in situ characterization, giving examples of the probable development of the discussed techniques as well as an introduction of emerging tools such as scanning transmission X‐ray microscopy, ptychography, and X‐ray photon correlation spectroscopy.