Premium
New Strategies for e‐Beam Characterization of Catalysts
Author(s) -
Howie A.
Publication year - 2011
Publication title -
chemcatchem
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.497
H-Index - 106
eISSN - 1867-3899
pISSN - 1867-3880
DOI - 10.1002/cctc.201000171
Subject(s) - characterization (materials science) , secondary electrons , catalysis , photon , nanotechnology , coincidence , cathode ray , signal (programming language) , scanning electron microscope , electron , nanoparticle , beam (structure) , energy (signal processing) , electron microscope , materials science , optics , engineering physics , physics , computer science , chemistry , nuclear physics , medicine , alternative medicine , pathology , programming language , biochemistry , quantum mechanics
Building on the success of aberration correction and the construction of in situ reaction chambers, electron microscopy is poised to make fresh advances in catalyst characterization. More profitable use should be made of photons both as input drivers and as output signals. Secondary electron imaging can provide extra information about the support structure. When collected in coincidence with primary beam energy losses, the secondary electron signal may even open the way to surface barrier height measurement at surface facets on individual nanoparticles.