Premium
Autoneutralizing anions as a neutral beam probe for the analysis of insulating materials
Author(s) -
Delmore J. E.,
Appelhans A. D.,
Shomo R. E.,
Dahl D. A.
Publication year - 1988
Publication title -
biomedical and environmental mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0887-6134
DOI - 10.1002/bms.1200160143
Subject(s) - sulfur hexafluoride , ion , protonation , molecule , gas phase , beam (structure) , sulfur , range (aeronautics) , ion beam , molecular beam , analytical chemistry (journal) , chemistry , materials science , inorganic chemistry , organic chemistry , optics , physics , composite material
A well‐focused beam of fast (2.5–25 keV) sulfur hexafluoride neutral molecules has been developed based upon the autoneutralizing sulfur hexafluoride gas‐phase anion. This molecular beam has been used to sputter gas‐phase ions from dry solids with excellent results from a wide range of materials that include plastics and pharmaceuticals. Most pharmaceuticals have yielded predominantly protonated parent ions, with fragments typical of the molecular structure. Detection limits for these pharmaceuticals are around 1 ng.