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Principles and Applications of Force Spectroscopy Using Atomic Force Microscopy
Author(s) -
Kim Youngkyu,
Kim Woong,
Park Joon Won
Publication year - 2016
Publication title -
bulletin of the korean chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.237
H-Index - 59
ISSN - 1229-5949
DOI - 10.1002/bkcs.11022
Subject(s) - force spectroscopy , molecule , spectroscopy , atomic force microscopy , chemical physics , chemistry , nanotechnology , polymer , microscopy , resolution (logic) , kelvin probe force microscope , molecular dynamics , analytical chemistry (journal) , materials science , computational chemistry , physics , optics , organic chemistry , computer science , quantum mechanics , artificial intelligence
Single‐molecule force spectroscopy is a powerful technique for addressing single molecules. Unseen structures and dynamics of molecules have been elucidated using force spectroscopy. Atomic force microscope ( AFM )‐based force spectroscopy studies have provided picoNewton force resolution, subnanometer spatial resolution, stiffness of substrates, elasticity of polymers, and thermodynamics and kinetics of single‐molecular interactions. In addition, AFM has enabled mapping the distribution of individual molecules in situ , and the quantification of single molecules has been made possible without modification or labeling. In this review, we describe the basic principles, sample preparation, data analysis, and applications of AFM ‐based force spectroscopy and its future.