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An improved model for analyzing the small angle x‐ray scattering of starch granules
Author(s) -
Daniels D. R.,
Donald A. M.
Publication year - 2003
Publication title -
biopolymers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.556
H-Index - 125
eISSN - 1097-0282
pISSN - 0006-3525
DOI - 10.1002/bip.10341
Subject(s) - small angle x ray scattering , scattering , starch , stack (abstract data type) , chemistry , transverse plane , layer (electronics) , crystallography , work (physics) , optics , physics , thermodynamics , organic chemistry , computer science , structural engineering , programming language , engineering
The structure of starch was studied using small‐angle x‐ray scattering (SAXS). The scattering data was modeled by considering a finite stack of alternating lamellae that are allowed to fluctuate both along the layer repeat direction and along the transverse layer direction. Analysis in this way of the SAXS data from starch allowed fresh insights into the native structure of several starch species, particularly potato starch. The novel model presented in this work was able to capture the experimentally observed SAXS patterns much better than previous models, which did not incorporate transverse layer fluctuations. © 2003 Wiley Periodicals, Inc. Biopolymers 69: 165–175, 2003