Premium
A high sensitivity system for luminescence measurement of materials
Author(s) -
Finch Adrian A.,
Wang Yafang,
Townsend Peter D.,
Ingle Martin
Publication year - 2019
Publication title -
luminescence
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.428
H-Index - 45
eISSN - 1522-7243
pISSN - 1522-7235
DOI - 10.1002/bio.3606
Subject(s) - radioluminescence , luminescence , materials science , microsecond , optically stimulated luminescence , cathodoluminescence , optoelectronics , thermoluminescence , photoluminescence , optics , spectrometer , irradiation , luminescent measurements , detector , physics , scintillation , nuclear physics
A unique combined and multi‐disciplinary wavelength multiplexed spectrometer is described. It is furnished with high‐sensitivity imaging plate detectors, the power to which can be gated to provide time‐resolved data. The system is capable of collecting spectrally resolved luminescence data following X‐ray excitation [radioluminescence (RL) or X‐ray excited optical luminescence (XEOL)], electron irradiation [cathodoluminescence (CL)] and visible light from light emitting diodes (LEDs) [photoluminescence (PL)]. Time‐resolved PL and CL data can be collected to provide lifetime estimates with half‐lives from microsecond timeframes. There are temperature stages for the high and low temperature experiments providing temperature control from 20 to 673 K. Combining irradiation, time resolved (TR) and TR‐PL allows spectrally‐resolved thermoluminescence (TL) and optically stimulated luminescence (OSL). The design of two detectors with matched gratings gives optimum sensitivity for the system. Examples which show the advantages and multi‐use of the spectrometer are listed. Potential future experiments involving lifetime analysis as a function of irradiation, dose and temperature plus pump‐probe experiments are discussed.