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Full analytical evaluation of the line shift and line width of ions in solids for Raman processes
Author(s) -
Eser Erhan,
Koç Hüseyin
Publication year - 2018
Publication title -
luminescence
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.428
H-Index - 45
eISSN - 1522-7243
pISSN - 1522-7235
DOI - 10.1002/bio.3431
Subject(s) - line width , line (geometry) , raman spectroscopy , thermal , ion , thermal expansion , spectral line , materials science , computational physics , physics , thermodynamics , optics , mathematics , quantum mechanics , geometry
In this paper, we present a new analytical method to evaluate the temperature dependence of the thermal line shift and thermal line width of spectral lines in the Raman process using a simple approximation for the Debye functions. The proposed formulae guarantee the accurate and fast calculation of the thermal line shift and thermal line width. As an example of application, the analytical expression obtained is used to calculate the line shift and line width of the 2 E → 4 A 2 transitions in V 2+ :MgO at temperatures from 0 K up to 500 K. This analytical evaluation shows that our results are satisfactory for the wide range temperature variations.