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Experimental test and life estimation of the OLED at normal working stress based on the luminance degradation model
Author(s) -
Zhang J. P.,
Wang C.,
Chen X.,
Cheng G. L.,
Qiu Y. J.,
Shen M.H. H.
Publication year - 2015
Publication title -
luminescence
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.428
H-Index - 45
eISSN - 1522-7243
pISSN - 1522-7235
DOI - 10.1002/bio.2741
Subject(s) - luminance , oled , weibull distribution , degradation (telecommunications) , computer science , materials science , simulation , mathematics , statistics , computer vision , telecommunications , composite material , layer (electronics)
In order to accurately acquire the life time information for the organic light emitting diode (OLED), an experiment based on the normal stress life test was carried out to gain the data for the luminance degradation tests. The luminance degradation model of OLED was established based on the Weibull function and the least square method. Combined with luminance degradation data, Weibull parameters were estimated, the qualitative and the quantitative relationship between the initial luminance and the OLED life was obtained, and the life estimation of the product was achieved. Numerical results show that the test scheme is feasible, the luminance degradation model proves to be reliable for the OLED life estimation, and the fitting accuracy is very high by comparison with the test data fluctuation. Moreover, the real life time of the OLED is measured, which can verify the validity of the assumptions used in accelerated life test methods and provide manufacturers and customers with significant guidelines. Copyright © 2014 John Wiley & Sons, Ltd.