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Probability Model for Crop Yield Forecasting
Author(s) -
Jain R. C.,
Agrawal Ranjana
Publication year - 1992
Publication title -
biometrical journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.108
H-Index - 63
eISSN - 1521-4036
pISSN - 0323-3847
DOI - 10.1002/bimj.4710340410
Subject(s) - yield (engineering) , markov chain , sowing , crop , mathematics , statistics , crop yield , agronomy , biology , materials science , metallurgy
Markov chain approach has been adopted to forecast sugarcane yield. Two years data (1977–78 and 1978–79) on biometrical characters and yield collected by IASRI, New Delhi under the pilot study on pre‐harvest forecasting of sugarcane yield in Meerut district (U.P.) were utilised for the study. Yield forecasts at 7–8 months after planting (about 2–3 months before harvest) were very close to the observed ones, per cent deviations from observed being 4% in 1978–79 and 2% in 1977–78. This study thus reveals that Markov Chain method can be successfully used in crop yield forecasting.