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Testing against Ordered Alternatives in One‐way Layout
Author(s) -
Rao K. S. Madhava,
Gore A. P.
Publication year - 1984
Publication title -
biometrical journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.108
H-Index - 63
eISSN - 1521-4036
pISSN - 0323-3847
DOI - 10.1002/bimj.4710260105
Subject(s) - nonparametric statistics , simple (philosophy) , class (philosophy) , statistics , statistical hypothesis testing , mathematics , yield (engineering) , computer science , econometrics , test (biology) , mathematical optimization , artificial intelligence , philosophy , materials science , epistemology , metallurgy , paleontology , biology
In this paper we investigate a simple method of modifying well known nonparametric tests for the several samples location problem to yield a class of test statistics suitable for ordered alternatives. Optimum member of the class is identified in each case and its efficacy obtained. The method is applied to five statistics.

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