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Project NEMESIS: Perception of a 50 Hz electric and magnetic field at low intensities (laboratory experiment)
Author(s) -
Mueller Christopher H.,
Krueger Helmut,
Schierz Christoph
Publication year - 2002
Publication title -
bioelectromagnetics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.435
H-Index - 81
eISSN - 1521-186X
pISSN - 0197-8462
DOI - 10.1002/bem.95
Subject(s) - audiology , perception , psychology , stressor , medicine , clinical psychology , neuroscience
Abstract The Electrical Hypersensitivity Syndrome (EHS) is a condition where people suffer from various nonspecific health symptoms attributed to an assumed adverse effect of electric and magnetic fields (EMF). Many EHS patients report the ability to consciously perceive EMF at very low intensities. The existence of a direct EMF perception could be the key to explain at least partially the aetiology of EHS through stress mechanisms and allow the comparison with well known environmental stressors such as noise or odor. The double blind laboratory experiment tested the hypothesis that there are subjects with the ability to perceive 50 Hz EMF at 100 V/m and 6 μT (EMF sensitive) and to investigate the prevalence of EMF sensitivity in a group consisting of subjects with or without self‐reported EHS. A total of 63 volunteers, 49 with EHS and 14 controls, took part in the EMF perception experiment, where 10 sham and 10 exposed 2 min blocks had to be judged in randomized sequence (field on/field off). Seven out of 63 subjects reached a statistically significant result which points to the existence of a small EMF sensitive subgroup within the study group. There was no relevant difference between the subjects with self reported EHS and those without in terms of the success rate in the field perception experiment, as well as the number and types of symptoms encountered during the test. The results of the EMF perception experiment suggest that EHS is not a prerequisite for the ability to consciously perceive weak EMF and vice versa. Bioelectromagnetics 23:26–36, 2002. © 2002 Wiley‐Liss, Inc.