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14.6 mT ELF magnetic field exposure yields no DNA breaks in model system Salmonella , but provides evidence of heat stress protection
Author(s) -
Williams Parley A.,
Ingebretsen Richard J.,
Dawson Renee J.
Publication year - 2006
Publication title -
bioelectromagnetics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.435
H-Index - 81
eISSN - 1521-186X
pISSN - 0197-8462
DOI - 10.1002/bem.20210
Subject(s) - dna damage , recombination , dna , heat stress , mutant , microbiology and biotechnology , biophysics , biology , chemistry , genetics , gene , zoology
In this study, we demonstrate that common extremely low frequency magnetic field (MF) exposure does not cause DNA breaks in this Salmonella test system. The data does, however, provide evidence that MF exposure induces protection from heat stress. Bacterial cultures were exposed to MF (14.6 mT 60 Hz field, cycled 5 min on, 10 min off for 4 h) and a temperature‐matched control. Double‐ and single‐stranded DNA breaks were assayed using a recombination event counter. After MF or control exposure they were grown on indicator plates from which recombination events can be quantified and the frequency of DNA strand breaks deduced. The effect of MF was also monitored using a recombination‐deficient mutant ( recA ). The results showed no significant increase in recombination events and strand breaks due to MF. Evidence of heat stress protection was determined using a cell viability assay that compared the survival rates of MF exposed and control cells after the administration of a 10 min 53 °C heat stress. The control cells exhibited nine times more cell mortality than the MF exposed cells. This Salmonella system provides many mutants and genetic tools for further investigation of this phenomenon. Bioelectromagnetics 27:445–450, 2006.© 2006 Wiley‐Liss, Inc.