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A new system of skip‐lot sampling plans having a provision for reducing normal inspection
Author(s) -
Balamurali S.,
Jun ChiHyuck
Publication year - 2010
Publication title -
applied stochastic models in business and industry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.413
H-Index - 40
eISSN - 1526-4025
pISSN - 1524-1904
DOI - 10.1002/asmb.844
Subject(s) - computer science , sampling (signal processing) , statistics , operations management , operations research , mathematics , engineering , computer vision , filter (signal processing)
The skip‐lot sampling program can be used for reducing the amount of inspection on a product that has excellent quality history. Thus skip‐lot sampling plans are designed to reduce inspection costs. Moreover, the skip‐lot concept is sound and useful and is economically advantageous to use in the design of sampling plans. Hence, a new system of skip‐lot sampling plans designated as the SkSP‐V plan is developed in this paper. The proposed plan requires a return to normal inspection whenever a lot is rejected during sampling inspection, but has a provision for a reduced normal inspection upon demonstration of superior product quality. A Markov chain formulation and derivation of performance measures for this new plan are presented. The properties of SkSP‐V plan are studied with single sampling plan as the reference plan. Advantages of this new plan are also discussed. Finally, certain cost models are given for the economic design of the SkSP‐V plan. Copyright © 2010 John Wiley & Sons, Ltd.